Press

Photo Research® is pleased to announce its latest Light Measurement Solutions!

Wednesday, August 10, 2016 - 13:09

August 3, 2016

Dear Valued Customers,

My name is Bill Polinsky and I am the managing Director of Photo Research. It was with great enthusiasm that I previously announced the relocation of Photo Research operations from Chatsworth, California to Syracuse, New York inside of JADAK, LLC. JADAK is a sister company to Photo Research within Novanta and my team is in the process of combining operations in Syracuse, NY. JADAK and Photo Research will combine to create what we call the “Vision Technology Center of Excellence,”... More

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Thursday, March 9, 2017 - 13:37

PR-788 Features an Internal Neutral Density Filter, Allowing Users to Measure Higher Luminance Levels

SYRACUSE, N.Y. March 8, 2017 – Photo Research, a leader in world-class light and color measurement solutions, recently released its newest version of the PR-74X series of spectral measuring systems, the PR-788. The Spectrascan® PR-788, an extended dynamic range spectroradiometer, is used in Research & Development, Quality Control and Analysis, and production floor applications for flat panel display, automotive,... More

PR 788
Thursday, March 9, 2017 - 13:54

Conceptually, Mura algorithms attempt to correlate visual non-uniformities in digital terms. There are many descriptions of MURA, but in Photo Research’s VideoWin software application, there are six fundamental Mura measures: Luminance Edge Area, Luminance Mura Area, Luminance Lightness Area, Color Edge Area, Color Mura Area, and Color Lightness Area.

Mura: any local non-uniformity due to the unevenness of light emission

Conceptually, Mura algorithms attempt to correlate visual non-uniformities in digital terms... More

MURA Measurement
Thursday, March 9, 2017 - 14:03

Insuring that self-emissive technologies, such as information display monitors, LED lighting, or digital projectors, meet or exceed performance specifications requires precise characterization through accurate measurements. While there are several measurement technologies available for device characterization, two of the most commonly-used instrument types are filter colorimeters and spectroradiometers.

Filter Colorimeters

A basic filter colorimeter consists of:

• Collection Optics: This could be a... More

PR 655 Spectroradiometer

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